<<
>>

methods of a X-ray diffraction analysis for examination of thin-film structures

In the given operation by one of research techniques of structural properties of thin-film samples where in each sample 4 or 5 stratums were, there was a method of X-ray diffraction.

The method of X-ray diffraction of examination of crystalline structure is grounded on the phenomenon of a X-ray diffraction from planes of a crystalline lattice of explored samples.

The basic advantage of the given method is that he allows to gain the information on not changed state of the sample and effect of the analysis is immediately definition of substance or its components. X-rays get into a crystal, i.e. linking; moreover, in case of polymorphic bodies X-rays give the chance to distinguish the separate updatings peculiar to given substance.

Experiments have been executed on installation D8 DISCOVER of firm Bruker AXS in Scientifically-technological Park "Factory" BFU of I.Kanta (Kaliningrad). The given installation allows to spend rentgenodifraktsionnye examinations of materials, including methods of a diffractometry of the high and low resolution, a diffractometry of the high resolution under sliding corners, build-ups of cards of return space, a reflectometry, and also examination of a texture and voltages in a self-acting mode.

As a result of carrying out of experiments on the given installation it is possible: to spend phase and a structure analysis of solid bodies (powders, polycrystals); to explore morphology of interlaminar boundaries in structural structures, with thickness of stratums up to several mono stratums; to study features of morphology of a surface and pripoverhnostnyh stratums on depth (from the tenth shares nanometra).

Examinations by a method of X-ray diffraction have been spent by means of a X-ray bundle of radiation Cu-Kal:СиКа2 2:1 with mm section 1*0,2. As the detector detector Linxeye with the angular resolution 2,125 ° has been used.

Measurings were spent with a step 0,096 hailstones within corners from 10 ° to 100 °. Also for definition of roughnesses and thickness of stratums experiments in geometry of a sliding bundle have been made. Also for definition of morphology of interfaces in samples experiments have been made

The X-ray reflectometry which effects are presented in a Fig. 2.4. Effects of similar examinations have been shown, for example, in operations [125, 164, 166].

Because densities of a permalloy and IrMn are close, these stratums by means of the given procedure trudnorazlichimy, therefore the gained effects mismatch the validity, i.e. the gained thickness, densities and roughnesses of stratums is strongly separated with other observational facts. In particular, as it will be shown more low, effects of experiments by means of PEM have confirmed quantities of thickness of stratums in the samples, estimated prestressly on a method of a return Rutherford scattering.

Fig. 2.4. XRR-spectra for samples with nizkonikelevym a permalloy:

LNiPy (10 hm) ∕IγM π (8 hm) / LNiPy (K) nanometer);

LNiPy (K) hm) ∕IγM π (6 hm) / LNiPy (K) nanometer).

2.4.

<< | >>
A source: Gritsenko Christina Aleksandrovna. Features of processes of magnetisation reversal magnitostaticheski - and obmenno - the bound thin-film structures on the basis of permalloys. The dissertation on competition of a scientific degree of the candidate of physical and mathematical sciences. Kaliningrad - 2018. 2018

More on topic methods of a X-ray diffraction analysis for examination of thin-film structures:

  1. appearing through electronic microscopy for examination of thin-film structures
  2. a vibrating magnetometry for examination of magnetic properties of thin-film structures with an undirectional anisotropy
  3. Reception of thin-film condenser structures
  4. CHAPTER 3. FEATURES OF FORMATION OF PROPERTIES OBMENNOYOSVJAZANNYH OF THIN-FILM STRUCTURES ON THE BOTTOM IT IS HIGH - OR NIZKONIKELEVOGO THE PERMALLOY
  5. the Phenomenon fleksoelektrichestva in thin-film structures
  6. features of exchange bias in thin-film structures on the basis of alloys NiFe and IrMn.
  7. a method magnetronnogo a dusting for making of thin-film structures with an undirectional anisotropy
  8. CHAPTER 1. THE LITERATURE REVIEW. FEATURES OF EXCHANGE BIAS IN THIN-FILM STRUCTURES
  9. the up-to-date theoretical models featuring effect of exchange bias in thin-film structures
  10. X-ray diffraction topography
  11. magnetic properties of double-layer thin-film structures with various order of sedimentation of the ferromagnetic and antiferromagnetic stratums depending on a thickness of an antiferromagnetic stratum