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nuclear power microscopy for examination of morphology of surfaces of thin films

In the given operation the method of nuclear power microscopy (ACM) has been used for examination of morphology of surfaces of thin films for the purpose of reception of the information on roughnesses of surfaces of separate films of ferromagnetic NiFe and separate films of antiferromagnet IrMn.

Experiments have been spent by means of installation completely automated scanning zondovogo microscope Smart SPM of firm Aist-NT in Scientifically-technological Park "Factory" BFU of I.Kanta (Kaliningrad). The given installation allows to carry out examinations of surfaces of various objects with nanometrovym the spatial resolution in aerial medium with high velocity of scanning. The peak size of field of scanning on the given installation 100x100x15 a micron with possibility to spend the automated measurings.

Examinations of morphology of surfaces of thin films have been spent in the Expert - a mode with kantileverom 190 microns on frequency 270 kgts. Experiments were spent for thin-film samples Ta∕NiFe and That / І gmp.

Also by means of the given installation experiments on a procedure of magnetic power microscopy (MCM) for examination of micromagnetic structure of samples for the purpose of reception of the information on their domain structure have been made.

2.3.

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A source: Gritsenko Christina Aleksandrovna. Features of processes of magnetisation reversal magnitostaticheski - and obmenno - the bound thin-film structures on the basis of permalloys. The dissertation on competition of a scientific degree of the candidate of physical and mathematical sciences. Kaliningrad - 2018. 2018

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