nuclear power microscopy for examination of morphology of surfaces of thin films
In the given operation the method of nuclear power microscopy (ACM) has been used for examination of morphology of surfaces of thin films for the purpose of reception of the information on roughnesses of surfaces of separate films of ferromagnetic NiFe and separate films of antiferromagnet IrMn.
Experiments have been spent by means of installation completely automated scanning zondovogo microscope Smart SPM of firm Aist-NT in Scientifically-technological Park "Factory" BFU of I.Kanta (Kaliningrad). The given installation allows to carry out examinations of surfaces of various objects with nanometrovym the spatial resolution in aerial medium with high velocity of scanning. The peak size of field of scanning on the given installation 100x100x15 a micron with possibility to spend the automated measurings.Examinations of morphology of surfaces of thin films have been spent in the Expert - a mode with kantileverom 190 microns on frequency 270 kgts. Experiments were spent for thin-film samples Ta∕NiFe and That / І gmp.
Also by means of the given installation experiments on a procedure of magnetic power microscopy (MCM) for examination of micromagnetic structure of samples for the purpose of reception of the information on their domain structure have been made.
2.3.
More on topic nuclear power microscopy for examination of morphology of surfaces of thin films:
- 4.2 Examination of a self-polarised state and local polarisation of thin films TSTS by a method of power microscopy of the piezoelectric response.
- 3.3 Comparison of effects on examination fraktalnyh properties nanorazmernyh films of gold, argentum: atomno-power and tunnel microscopy
- Chapter 3. Examination of morphology of a relief, fraktalnyh properties of a surface and electrical performances of contact a sonde-sample for nanorazmernyh metal films on the dielectric substrates a method of scanning tunnel microscopy
- appearing through electronic microscopy for examination of thin-film structures
- Optical microscopy of a surface of films
- thin films
- the Phase analysis of thin films TSTS
- Change of properties of thin films TSTS at a variation of pressure of working gas
- Temperature measurings of the dielectric performances of thin films TSTS
- 3.1. Examination of morphology of a relief and fraktalnyh properties of the sample «gold on mica»
- Atomno-power microscopy
- Ekvivalentnostultratonkih polymeric films on solid surfaces and the filled polymeric matrixes
- the Thermodynamic approach to a problem of the dimensional dependence of temperature of fusion of thin films
- Bystrozakalyonnye strips and thin films
- temperature Influence otzhiga on a phase state, a microstructure and a composition of thin films TSTS
- examination of morphology of a relief of the sample «chrome on a glass»
- Chapter 3. Effects of examinations of a phase state, structure and a composition of thin films TSTS
- Methods of reception of thin ferroelectric films TSTS