Chapter 3. Examination of morphology of a relief, fraktalnyh properties of a surface and electrical performances of contact a sonde-sample for nanorazmernyh metal films on the dielectric substrates a method of scanning tunnel microscopy
Physically adequate configuration of the electronic plan of a scanning tunnel microscope plays important and in many respects spotting role in formation of images of a surface with the resolution of nuclear gauge.
Device approbation at tunnel contact between a scanning sonde and the sample can give both in examination of an initial surface, and to its mechanical infringement, and in some cases is a procedure of purposeful transport of one or groups of atoms [195]. Thus, use modelling of electrical performances of tunnel transition does testing of the electronic plan by trustier and increments repeatability of effects.In operation [196] the theoretical approach allowing correctly to pick up the plan of electronic builders which is used some kind of as a simulator of tunnel contact is featured. Besides, with a view of practical use of an offered simulator and its application in the metrological plan the structure (the electronic plan) scanning tunnel microscope is in detail featured.
In a number of monographies and dissertations of foreign authors (we will score in particular [197]) examination BAX of contact a sonde-sample (there is even a special term tip spectroscopy) anticipate and are necessary for reception of the sufficient resolution at studying of a surface, an estimate of influence of noise and adjustment of corresponding filters in CTM.
More on topic Chapter 3. Examination of morphology of a relief, fraktalnyh properties of a surface and electrical performances of contact a sonde-sample for nanorazmernyh metal films on the dielectric substrates a method of scanning tunnel microscopy:
- Chapter 1. The up-to-date state of examinations in the field of studying of morphological performances nanochastits and electrical performances of tunnel contact a sonde-sample methods nuclear, zondovoj and tunnel microscopy
- examination of electrical performances of tunnel contact a sonde-sample
- 3.3 Comparison of effects on examination fraktalnyh properties nanorazmernyh films of gold, argentum: atomno-power and tunnel microscopy
- about a procedure of preparation of samples for studying fraktalnoj dimensionality and electrical properties of contact a sonde-sample by means of a scanning tunnel microscope
- 3.1. Examination of morphology of a relief and fraktalnyh properties of the sample «gold on mica»
- examination of morphology of a relief and fraktalnyh properties of the sample «argentum on mica»
- computer modelling of process of interaction of a sonde of a power tunnel microscope with the sample on an example of system copper (sonde) - gold (sample)
- examination of morphology of a relief of the sample «chrome on a glass»
- nuclear power microscopy for examination of morphology of surfaces of thin films
- 4.2 Examination of a self-polarised state and local polarisation of thin films TSTS by a method of power microscopy of the piezoelectric response.