Physics of semiconductors
 Guseynov Niyàzi Muzafarovich. Influence of polarisation of phonons on transport of phonons in semiconductors and dielectrics. 0000
Influence of polarisation of phonons on transport of phonons in semiconductors and dielectrics: silt RSL of OD 61:851/1061
 Kazakov Valentin Vasilevich. Influence of the plus and subzero pressure on phase transition in some shirokoshchelnyh, uzkoshchelnyh and a schistose ferroelectric material . 0000
Influence of the plus and subzero pressure on phase transition in some shirokoshchelnyh, uzkoshchelnyh and a schistose ferroelectric material: silt RSL of OD 61:851/709  Ibragimov Nuraddin Aziz ogli. Influence of the uniaxial strain on physical properties of linkings of type Su2S and Cu2Se. 0000
Influence of the uniaxial strain on physical properties of linkings of type Su2S and Cu2Se: silt RSL of OD 61:851/2487  Tkach Valentin Ivanovich. Influence of strain on charging streamlining in crystals. 0000
Influence of strain on charging streamlining in crystals: silt RSL of OD 61:851/1287
 Gasimov SHafag Guseyn ogli. Influence of pressure on galvanomagnetic properties of semiconductor linkings TlSe and its analogues. 0000
Influence of pressure on galvanomagnetic properties of semiconductor linkings TlSe and its analogues: silt RSL of OD 61:851/424  Lyu Sin Nam 0. Influence of exterior actions on structure and some physical properties fosfida gallium and silicon . 0000
Influence of exterior actions on structure and some physical properties fosfida gallium and silicon: silt RSL of OD 61:851/2509  Ilchenko Lyudmila Georgievna. Interaction of charges on demarcations of condensed mediums and in schistose systems. 0000
Interaction of charges on demarcations of condensed mediums and in schistose systems: silt RSL of OD 61:851/217
 Krasilshikov Boris Romanovich. Likelihood models of transient electrical strength and currents of leakage of is casualnonuniform condenser dielectrics. 0000
Likelihood models of transient electrical strength and currents of leakage of is casualnonuniform condenser dielectrics: silt RSL of OD 61:851/1541  Kulakov Mihail Aleksandrovich. Ultrasonic microscopy of solidstate structures. 0000
Ultrasonic microscopy of solidstate structures: silt RSL of OD 61:851/2206

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